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There are two main failure modes of the ECAS series. An accidental failure mode occurs if more than the allowable load such as thermal stress, electrical stress or mechanical stress is applied. Rarely will this cause the breakdown of the dielectric layer and reach the short mode. The more common failure mode is wear-out failure. This is driven by reduced conductivity of the polymer resulting in decreased capacitor value under high temperature over time, and eventually becomes open mode. On this slide, the capacitance reduction is toward the end of the life time of the capacitor and is gradual, as shown in the capacitor change over time graph obtained during high temperature under load life test.
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