While a constant aperture delay does not cause errors in the dynamic performance of an ADC, aperture jitter is a significant source of error at high input frequencies. The jitter can occur internally to the ADC, or externally on the sampling clock. Regardless of where the jitter originates, the effects are indistinguishable. In most cases, the jitter on the sampling clock is larger than that of the ADC. ADI has several low-jitter clock sources that can reduce the errors due to aperture jitter.

